Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern
Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern
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DOI：
10.1515/nanoph-2022-0612
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发表时间：
2023-01
期刊：
影响因子：
7.5
通讯作者：
E. A. Chan;C. Rendón-Barraza;Benquan Wang;T. Pu;J. Ou;Hongxin Wei;G. Adamo;Bo An;N. Zheludev
中科院分区：
文献类型：
--
作者：
E. A. Chan;C. Rendón-Barraza;Benquan Wang;T. Pu;J. Ou;Hongxin Wei;G. Adamo;Bo An;N. Zheludev
摘要颗粒计数对于纳米技术、环境监测、制药、食品和半导体工业至关重要。在这里，我们介绍了一种超分辨率单次光学方法，用于计数和映射表面上的亚波长粒子的位置。该方法基于对散射在颗粒群上的相干光的强度分布的深度学习分析。在原理实验的证明中，我们证明了超过90%的颗粒计数精度。我们还证明了粒子的位置可以映射到一个4 × 4的网格，几乎完美的精度（16像素的粒子系综二进制成像）。粒子数量的检索和它们的映射都是通过超分辨率实现的：对于具有紧密定位的光学不可分辨粒子的集合和具有稀疏定位的粒子的集合，精度是相似的。由于该方法不需要对颗粒进行荧光标记，对颗粒尺寸的小变化具有弹性，可以用于计数各种类型的纳米颗粒和高速率，因此可以在纳米技术，生命科学等领域的许多颗粒计数任务中找到应用。
Abstract Particle counting is of critical importance for nanotechnology, environmental monitoring, pharmaceutical, food and semiconductor industries. Here we introduce a super-resolution single-shot optical method for counting and mapping positions of subwavelength particles on a surface. The method is based on the deep learning analysis of the intensity profile of the coherent light scattered on the group of particles. In a proof of principle experiment, we demonstrated particle counting accuracies of more than 90%. We also demonstrate that the particle locations can be mapped on a 4 × 4 grid with a nearly perfect accuracy (16-pixel binary imaging of the particle ensemble). Both the retrieval of number of particles and their mapping is achieved with super-resolution: accuracies are similar for sets with closely located optically unresolvable particles and sets with sparsely located particles. As the method does not require fluorescent labelling of the particles, is resilient to small variations of particle sizes, can be adopted to counting various types of nanoparticulates and high rates, it can find applications in numerous particles counting tasks in nanotechnology, life sciences and beyond.