Field-emission breakdown and electromigration in insulated planar nanoscopic contacts
Field-emission breakdown and electromigration in insulated planar nanoscopic contacts
复制标题
DOI：
10.1109/ted.2006.885659
复制
发表时间：
2006-12-01
影响因子：
3.1
通讯作者：
Rinaldi, Ross
中科院分区：
文献类型：
--
作者：
Bramanti, Alessandro;Maruccio, Giuseppe;Rinaldi, Ross
观察到平面纳米接触经历了早期的电击穿。作者认为，其原因是能够触发电迁移的高场发射。这一现象可以用经验的电流-电压定律很好地描述，这与通常在非平坦场发射体中发现的完全不同；这归因于触点的特殊几何形状。尽管该定律的数学形式总是相同的，但击穿电流的强度随着样品的变化而变化，范围在几个数量级内；这可以用发射表面的纳米粗糙度来解释。它们还表明，击穿的发生可能取决于外加电压的极性。
Planar nanoscopic contacts are observed to undergo early electrical breakdown. The authors show that the cause is high field emission capable of triggering electromigration. The phenomenon is well described by an empirical current-voltage law, well different from that usually found in nonflat field emitters; this is attributed to the particular geometry of the contacts. Although the mathematical form of the law is always the same, the intensity of breakdown current changes from sample to sample, ranging over several orders of magnitude; this is explained by the nanoscopic roughness of the emitting surfaces. They also show that the occurrence of breakdown may be dependent on the polarity of the applied voltage.