Visible-Light-Induced Oxidation of Poly(3-hexylthiophene-2,5-diyl) Thin Films on ZnO Surfaces under Humid Conditions: Study of Light Wavelength Dependence
Visible-Light-Induced Oxidation of Poly(3-hexylthiophene-2,5-diyl) Thin Films on ZnO Surfaces under Humid Conditions: Study of Light Wavelength Dependence
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潮湿条件下 ZnO 表面聚（3-己基噻吩-2,5-二基）薄膜的可见光诱导氧化：光波长依赖性的研究
DOI：
10.1021/acs.jpcc.6b03530
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发表时间：
2016
期刊：
影响因子：
--
通讯作者：
Y. D. Kim
中科院分区：
文献类型：
--
作者：
D. Kim;H. Seo;Sang;E. Park;Myung;Kwang‐Dae Kim;G. Gantefoer;Y. D. Kim
The oxidation behaviors of poly(3-hexylthiophene-2,5-diyl) (P3HT) thin films (∼60 nm thickness)/ZnO irradiated with three different wavelengths of visible light (blue, green, and red) in a humid atmosphere were studied using X-ray photoelectron spectroscopy (XPS) and UV–vis spectroscopy. The formation of sulfoxide states upon visible-light irradiation was observed in the S 2p core-level XPS spectra, and more importantly, this oxidation became pronounced with decreasing wavelength of incident light. Photo-oxidation of P3HT films also resulted in a reduction in optical absorption. In contrast to the XPS results, changes in the UV–vis absorption spectrum were rather insensitive to the wavelength of incident visible light. The wavelength dependency of the photo-oxidation of P3HT films seen in the XPS spectra is attributed to the more pronounced photoinduced oxidation of locally disordered thiophene rings on the surfaces of P3HT films under irradiation with shorter-wavelength visible light. The population of l...
