Thickness dependence of the exchange bias in epitaxial manganite bilayers
Thickness dependence of the exchange bias in epitaxial manganite bilayers
复制标题
DOI：
10.1103/physrevb.79.094405
复制
发表时间：
2009-03-01
影响因子：
3.7
通讯作者：
Pennycook, S. J.
中科院分区：
文献类型：
--
作者：
Kobrinskii, A. L.;Goldman, A. M.;Pennycook, S. J.
研究了用臭氧辅助分子束外延技术在（001）SrTiO_3衬底上生长的一系列La_（2/3）Ca_（1/3）MnO_3/La_（1/3）Ca_（2/3）MnO_3双层膜的交换偏置。高结晶质量的样品和接口已被验证使用高分辨率X射线衍射仪和Z-对比扫描透射电子显微镜与电子能量损失谱。研究了反铁磁层厚度对交换偏置的影响。磁滞回线位移的起始临界值已被确定。通过将结果拟合到广义Meiklejohn-Bean模型，得到了反铁磁各向异性常数。
Exchange bias has been studied in a series of La2/3Ca1/3MnO3/La1/3Ca2/3MnO3 bilayers grown on (001) SrTiO3 substrates by ozone-assisted molecular-beam epitaxy. The high crystalline quality of the samples and interfaces has been verified using high-resolution x-ray diffractometry and Z-contrast scanning transmission electron microscopy with electron-energy-loss spectroscopy. The dependence of exchange bias on the thickness of the antiferromagnetic layer has been investigated. A critical value for the onset of the hysteresis loop shift has been determined. An antiferromagnetic anisotropy constant has been obtained by fitting the results to the generalized Meiklejohn-Bean model.