Optical configuration for measurement in speckle interferometry.
Optical configuration for measurement in speckle interferometry.
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用于散斑干涉测量的光学配置。
DOI：
10.1364/ol.21.001958
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发表时间：
1996
期刊：
影响因子：
3.6
通讯作者：
T. Santhanakrishnan
中科院分区：
文献类型：
--
作者：
Rajpal Singh Sirohi;N. K. Mohan;T. Santhanakrishnan
报道了一种用于面内位移测量和轮廓绘制的光学结构。在该方法中，相对于表面法线对称地观察物点，并在成像系统的图像平面上相干地组合物点。由于光束是通过像平面上的小孔组合在一起的，所以去相关的过程相当缓慢。由于去相关系数低，对于大的面内变形和大的角度倾斜，得到了条纹。该方法实现简单，灵敏度可在很大范围内变化。因此，该配置扩展了测量范围。
An optical configuration for measurement of in-plane displacement and for contouring is reported. In this method an object point is viewed symmetrically with respect to surface normal and combined coherently at the image plane of the imaging system. Because the beams are combined by small apertures at the image plane, decorrelation sets in rather slowly. Owing to low decorrelation, fringes have been obtained for large in-plane deformations and large angular tilts. The method is simple to implement, and its sensitivity can be varied over a wide range. The configuration, therefore, extends the range of measurement.