Soft x-ray microscopy with 7 nm resolution
Soft x-ray microscopy with 7 nm resolution
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DOI:
10.1364/optica.399885
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发表时间:
2020-11-20
期刊:
影响因子:
10.4
通讯作者:
David, Christian
中科院分区:
文献类型:
--
作者:
Roesner, Benedikt;Finizio, Simone;David, Christian
The availability of intense soft x-ray beams with tunable energy and polarization has pushed the development of highly sensitive, element-specific, and noninvasive microscopy techniques to investigate condensed matter with high spatial and temporal resolution. The short wavelengths of soft x-rays promise to reach spatial resolutions in the deep single-digit nanometer regime, providing unprecedented access to magnetic phenomena at fundamental length scales. Despite considerable efforts in soft x-ray microscopy techniques, a two-dimensional resolution of 10 nm has not yet been surpassed in direct imaging. Here, we report on a significant step beyond this long-standing limit by combining newly developed soft x-ray Fresnel zone plate lenses with advanced precision in scanning control and careful optical design. With this approach, we achieve an image resolution of 7 nm. By combining this highly precise microscopy technique with the x-ray magnetic circular dichroism effect, we reveal dimensionality effects in an ensemble of interacting magnetic nanoparticles. Such effects are topical in current nanomagnetism research and highlight the opportunities of high-resolution soft x-ray microscopy in magnetism research and beyond. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement