LOW ENERGY ELECTRON BEAM AS A NONDESTRUCTIVE DIAGNOSTIC TOOL FOR HIGH POWER BEAMS
LOW ENERGY ELECTRON BEAM AS A NONDESTRUCTIVE DIAGNOSTIC TOOL FOR HIGH POWER BEAMS
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低能电子束作为高功率电子束的无损诊断工具
DOI：
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发表时间：
2006
期刊：
影响因子：
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通讯作者：
P. Logatchov
中科院分区：
文献类型：
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作者：
P. Logatchov
本文讨论了低能电子束在强流诊断中的可能应用。该方法是基于在20-200 kV的能量范围内的细电子束在一个密集的聚束的电磁场的扫描。给出了电子束探针在BINP中应用的实验结果。这种方法可能的应用，特别是ILC和SNS束诊断系统进行了讨论。
This paper is devoted to possible applications of low energy electron beam in diagnostics of intense beams. The method is based on the scanning of the thin electron beam within the energy range 20-200 kV in the electromagnetic field of an intensive bunch. Experimental results of electron beam probe applications in BINP are presented. Possible applications of this approach for particular ILC and SNS beam diagnostic systems are discussed.