Extending Flash Lifetime in Embedded Processors by Expanding Analog Choice
Extending Flash Lifetime in Embedded Processors by Expanding Analog Choice
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DOI：
10.1109/tcad.2018.2857059
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发表时间：
2018-11-01
影响因子：
2.9
通讯作者：
Sorin, Daniel J.
中科院分区：
文献类型：
--
作者：
Mappouras, Georgios;Vahid, Alireza;Sorin, Daniel J.
我们利用传感器的数据本质上是模拟的这一事实，延长了嵌入式处理器中闪存的使用寿命。计算机架构社区的先前工作假设所有数据都是数字的，并且忽略了处理模拟数据时可用的机会，例如传感器记录的数据。在本文中，我们引入冗余的传感器数据的量化，以提供几种替代的表示。值得注意的是，我们权衡失真（感测到的模拟值与该值的数字量化之间的差异）以提高寿命。我们的模拟表明，当结合率，失真和寿命权衡，我们可以延长闪存寿命在一个小得多的容量成本相比，以前的工作。更具体地，模拟系统示出，与冗余闪存相比，可以实现高达2.75倍的容量成本，并且与现有技术的编码方案相比，可以实现高达1.29倍的容量成本。
We extend the lifetime of Flash memory in embedded processors by exploiting the fact that data from sensors is inherently analog. Prior work in the computer architecture community has assumed that all data is digital and has overlooked the opportunities available when working with analog data, such as the data recorded by sensors. In this paper, we introduce redundancy into the quantization of sensor data in order to provide several alternative representations. Notably, we trade-off distortion-the difference between the sensed analog value and the digital quantization of that value-to improve lifetime. Our simulations show that when combining rate, distortion, and lifetime tradeoffs we can extend Flash lifetime at a far smaller capacity cost compared to prior work. More specifically the simulated system shows that it is possible to achieve up to 2.75 x less capacity cost compared to redundant Flash memory and 1.29 x less capacity cost compared to the state of the art coding schemes.