Cryogenic Testing of High Current By‐Pass Diode Stacks for the Protection of the Superconducting Magnets in the LHC
Cryogenic Testing of High Current By‐Pass Diode Stacks for the Protection of the Superconducting Magnets in the LHC
复制标题
用于保护大型强子对撞机中超导磁体的高电流旁路二极管堆栈的低温测试
DOI：
10.1063/1.1774639
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发表时间：
2004
期刊：
影响因子：
--
通讯作者：
C. Rout
中科院分区：
文献类型：
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作者：
A. Gharib;D. Hagedorn;A. D. Corte;C. F. Zignani;S. Turtu;D. Brown;C. Rout
为了保护LHC超导磁体，DYNEX SEMICONDUCTOR LTD（林肯，GB）制造了大约2100个专门开发的旁路二极管，其中大约1300个二极管安装到二极管堆中，并在低温下进行测试。迄今为止，用于保护超导晶格偶极和晶格四极磁体的约800个偶极二极管堆和约250个四极二极管堆已在OCEM（意大利博洛尼亚）组装，并在ENEA（意大利弗拉斯卡蒂）的液氦中成功测试。本报告概述了迄今为止获得的测试结果。经过简短的测试装置和测试程序的描述，统计分析二极管生产过程中的测试数据，以及在液氦测试过程中的二极管堆的性能，包括故障率和二极管的退化。
For the protection of the LHC superconducting magnets, about 2100 specially developed by‐pass diodes were manufactured by DYNEX SEMICONDUCTOR LTD (Lincoln, GB) and about 1300 of these diodes were mounted into diode stacks and submitted to tests at cryogenic temperatures. To date about 800 dipole diode stacks and about 250 quadrupole diode stacks for the protection of the superconducting lattice dipole and lattice quadrupole magnets have been assembled at OCEM (Bologna,Italy) and successfully tested in liquid helium at ENEA (Frascati, Italy). This report gives an overview of the test results obtained so far. After a short description of the test installations and test procedures, a statistical analysis is presented for test data during diode production as well as for the performance of the diode stacks during testing in liquid helium, including failure rates and degradation of the diodes.