Lateral shearing interferometry of high-harmonic wavefronts
Lateral shearing interferometry of high-harmonic wavefronts
复制标题
DOI:
10.1364/ol.36.001746
复制
发表时间:
2011-05-15
期刊:
影响因子:
3.6
通讯作者:
Walmsley, Ian A.
中科院分区:
文献类型:
--
作者:
Austin, Dane R.;Witting, Tobias;Walmsley, Ian A.
We present a technique for frequency-resolved wavefront characterization of high harmonics based on lateral shearing interferometry. Tilted replicas of the driving laser pulse are produced by a Mach-Zehnder interferometer, producing separate focii in the target. The interference of the resulting harmonics on a flat-field extreme ultraviolet spectrometer yields the spatial phase derivative. A comprehensive set of spatial profiles, resolved by harmonic order, validate the technique and reveal the interplay of single-atom and macroscopic effects. (C) 2011 Optical Society of America