High-resolution examination of recording marks in phase-change media using a scanning near-field optical microscope
High-resolution examination of recording marks in phase-change media using a scanning near-field optical microscope
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使用扫描近场光学显微镜对相变介质中的记录标记进行高分辨率检查
DOI：
10.1143/jjap.39.3599
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发表时间：
2000
期刊：
影响因子：
--
通讯作者：
K. Ichihara
中科院分区：
文献类型：
--
作者：
T. Tadokoro;T. Saiki;K. Yusu;K. Ichihara
使用采用改进探针设计的扫描近场光学显微镜 (SNOM) 检查数字多功能光盘随机存取存储器 (DVD-RAM) 中的记录标记。这些标记记录在轨道间距为 0.6 µm 的实验性 DVD-RAM 介质上。 SNOM 的尖端尺寸比轨道宽度更宽，以避免轨道边缘产生光学重影。改变记录功率以研究标记形状对功率的依赖性，并且发现标记形状与再现信号良好相关。 SNOM 被认为是光学记录介质实用表征工具的良好候选者。
Recording marks in digital versatile disc-random access memory (DVD-RAM) were examined using a scanning near-field optical microscope (SNOM) incorporating an improved probe tip design. The marks were recorded on an experimental DVD-RAM medium with a track-pitch of 0.6 µm. The tip size of the SNOM was made wider than the track width in order to avoid optical ghosting arising from the track edge. The recording power was varied in order to investigate the dependence of the mark shape on power and it was found that the mark shape correlated well with the reproduced signal. The SNOM is considered to be a good candidate for a practical characterization tool for optical recording media.