First critical field measurements of superconducting films by third harmonic analysis
First critical field measurements of superconducting films by third harmonic analysis
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通过三次谐波分析首次测量超导薄膜的临界场
DOI：
10.1063/1.3211321
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发表时间：
2009
期刊：
影响因子：
--
通讯作者：
J. Villégier
中科院分区：
文献类型：
--
作者：
G. Lamura;M. Aurino;A. Andreone;J. Villégier
用电感非接触法可以高精度地测定超导薄膜样品的第一临界场（$B_{C1}$）的温度行为。在置于样品前的单线圈中驱动正弦电流，当Abrikosov涡旋进入样品时，在线圈中感应出非零的三次谐波电压V3。文中详细介绍了用该技术定量评价$B {C1}$应满足的条件。作为验证试验，测量了不同的第二类超导体（薄膜形式的Nb，NbN，MgB$_{2}$和Y$_{1}$Ba$_{2}$Cu$_{3}$O$_{7-d}$）。实验结果，文献中提出的数据和理论预测之间的比较，并进行了讨论。
The temperature behaviour of the first critical field ($B_{C1}$) of superconducting thin film samples can be determined with high accuracy using an inductive and contactless method. Driving a sinusoidal current in a single coil placed in front of the sample, a non zero third harmonic voltage $V_{3}$ is induced in it when Abrikosov vortices enter the sample. Conditions to be satisfied for the quantitative evaluation of $B_{C1}$ using this technique are detailed. As validation test, different type II superconductors (Nb, NbN, MgB$_{2}$ and Y$_{1}$Ba$_{2}$Cu$_{3}$O$_{7-d}$ under the form of thin films) have been measured. The comparison between experimental results, data presented in literature and theoretical predictions is presented and discussed.