Kan Takeshita, Yutaka Sasaki, Masahiro Kobashi, Yuki Tanaka, Shuichi Maeda, Akira Yamakata, Taka-aki Ishibashi, Hiroshi Onishi: "Effect of annealing temperature on back electron transfer and distribution of deep trap sites in dye-sensitized TiO_2, studied
Kan Takeshita, Yutaka Sasaki, Masahiro Kobashi, Yuki Tanaka, Shuichi Maeda, Akira Yamakata, Taka-aki Ishibashi, Hiroshi Onishi: "Effect of annealing temperature on back electron transfer and distribution of deep trap sites in dye-sensitized TiO_2, studied
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Kan Takeshita、Yutaka Sasaki、Masahiro Kobashi、Yuki Tanaka、Shuichi Maeda、Akira Yamakata、Taka-aki Ishibashi、Hiroshi Onishi：“研究了退火温度对染料敏化 TiO_2 中背电子转移和深陷阱位点分布的影响”
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