Probe based antenna measurements up to 325 GHz for upcoming millimeter-wave applications

Probe based antenna measurements up to 325 GHz for upcoming millimeter-wave applications
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基于探头的天线测量频率高达 325 GHz,适用于即将推出的毫米波应用

DOI:
10.1109/iwat.2013.6518338
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发表时间:
2013
期刊:
2013 International Workshop on Antenna Technology (iWAT)
影响因子:
--
通讯作者:
T. Zwick
T. Zwick
中科院分区:
--
文献类型:
--
作者:
H. Gulan;S. Beer;S. Diebold;C. Rusch;A. Leuther;I. Kallfass;T. Zwick

文献摘要

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在本文中,提出了一种基于探针的测量设置,允许在220 GHz和325 GHz之间的频率范围内的天线的特性。可以测量被测天线(AUT)的辐射方向图以及增益和回波损耗。给出了系统在精度和动态范围方面的极限。为了证明其功能,砷化镓(GaAs)基板上的240 GHz贴片天线进行测量。模拟和测量之间的比较显示出非常好的协议。
In this paper a probe based measurement setup is presented that allows the characterization of antennas in the frequency-range between 220 GHz and 325 GHz. The radiation pattern, as well as the gain and the return loss of the antenna under test (AUT) can be measured. The limits of the system in terms of accuracy and dynamic range are given. To demonstrate its functionality a 240 GHz patch-antenna on Gallium Arsenide (GaAs) substrate is measured. A comparison between simulation and measurement shows very good agreement.