Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability
Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability
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DOI：
10.1109/irps48227.2022.9764491
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发表时间：
2022-03
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通讯作者：
K. Watanabe;T. Shimada;K. Hirose;H. Shindo;D. Kobayashi;T. Tanigawa;S. Ikeda;Takamitsu Shinada;H. Koike;T. Endoh;T. Makino;Takeshi Ohshima
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作者：
K. Watanabe;T. Shimada;K. Hirose;H. Shindo;D. Kobayashi;T. Tanigawa;S. Ikeda;Takamitsu Shinada;H. Koike;T. Endoh;T. Makino;Takeshi Ohshima
我们展示了设计通过磁性隧道结 (MTJ) 增强的太空级低功耗 CMOS LSI 的尝试。通过高能重离子实验和宏自旋模拟结合单粒子瞬态噪声电流建模来讨论其有效性。还探讨了重离子可能引起的潜在损害。
We show our attempt to design space-grade low-power CMOS LSIs enhanced by magnetic tunnel junctions (MTJs). The validity is discussed by using high-energy heavy-ion experiments and macrospin simulations combined with single-event transient noise current modeling. Possible latent damage induced by heavy ions are also explored.