Fluorescent resolution target for super-resolution microscopy.
Fluorescent resolution target for super-resolution microscopy.
复制标题
用于超分辨率显微镜的荧光分辨率目标。
DOI：
10.1111/j.1365-2818.2003.01257.x
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发表时间：
2003
影响因子：
2
通讯作者：
Larson,DN
中科院分区：
文献类型：
--
作者：
Stark,PRH;Rinko,LJ;Larson,DN
历史上，荧光光学显微镜的分辨率一直受到瑞利判据的限制。然而，最近有几种技术已经达到了低于瑞利准则规定的分辨率。其中包括4 - Pi共聚焦显微镜、谐波激发光显微镜、受激发射耗尽显微镜、近场扫描光学显微镜和I5M。目前最广泛接受的分辨率测试方法是对一组紧密排列的荧光珠或分散在基质中的荧光珠进行成像。这表明该系统能够分辨给定直径的特征；然而，它并没有证明系统的经典分辨率。为了更好地表征系统的分辨率，我们制作了一个荧光分辨率靶。
Historically, resolution in fluorescence optical microscopy has been limited by the Rayleigh criterion. Recently, however, several techniques have achieved resolution below that specified by the Rayleigh criterion. Among these are 4‐Pi confocal microscopy, harmonic excitation light‐microscopy, stimulated emission depletion microscopy, near‐field scanning optical microscopy and I5M. The most widely accepted current method of resolution testing is to image an array of closely packed fluorescent beads or beads dispersed in a matrix. This shows that the system is capable of resolving a feature with a given diameter; however, it does not demonstrate the classical resolution of the system. We have fabricated a fluorescent resolution target for better characterization of a system's resolution.