Reliability and Scalability of p-Bits Implemented With Low Energy Barrier Nanomagnets
Reliability and Scalability of p-Bits Implemented With Low Energy Barrier Nanomagnets
复制标题
使用低能垒纳米磁体实现 p 位的可靠性和可扩展性
DOI：
10.1109/lmag.2019.2956913
复制
发表时间：
2019
影响因子：
1.2
通讯作者：
Supriyo Bandyopadhyay
中科院分区：
文献类型：
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作者：
J. Drobitch;Supriyo Bandyopadhyay
概率位（P-BITS（P-BITS）用低能屏障纳米磁铁（LBM）实现，因为它们可以非常有效地执行某些计算任务，尽管它们可以非常有效地执行某些计算任务。但是，LBMS在某些任务中并非完全免于缺陷和设备对设备的变化。编码），扩展的缺陷，例如在表面的很大一部分上的LBM厚度的变化，我们可能会损害功能。计算：使用外部代理“编程”概率的能力，例如注入LBM的自旋偏振电流。设备对设备的变化。通过增加电流的自旋极化，可以进一步抑制典型的概率 - 电流特征。因此，将可扩展到大量的P位。
Probabilistic bits (p-bits) implemented with low energy barrier nanomagnets (LBMs) have recently gained attention because they can be leveraged to perform some computational tasks very efficiently. Although more error resilient than Boolean computing, p-bit-based computing employing LBMs is, however, not completely immune to defects and device-to-device variations. In some tasks (e.g., binary stochastic neurons for machine learning and p-bits for population coding), extended defects, such as variation of the LBM thickness over a significant fraction of the surface, can impair functionality. We examine if unavoidable geometric device-to-device variations can have a significant effect on one of the most critical requirements for probabilistic computing: the ability to “program” probability with an external agent, such as a spin-polarized current injected into the LBM. We found that the programming ability is fortunately not lost with reasonable device-to-device variations. The little variation in the probability-versus-current characteristic caused by typical device variability can be suppressed further by increasing the spin polarization of the current. This shows that the probabilistic computing with LBMs is resistant against small geometric variations, and hence will be scalable to a large number of p-bits.
影响因子：
1.2
作者：
Hassan, Orchi;Faria, Rafatul;Datta, Supriyo
通讯作者：
Datta, Supriyo