Tip in Situ Chemical Modification and Its Effects on Tribological Measurements
Tip in Situ Chemical Modification and Its Effects on Tribological Measurements
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DOI：
10.1021/la9905618
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发表时间：
2000
期刊：
影响因子：
3.9
通讯作者：
Linmao Qian and;Xudong Xiao;S. Wen
中科院分区：
文献类型：
--
作者：
Linmao Qian and;Xudong Xiao;S. Wen
本文介绍了用正十八烷基三甲氧基硅烷(OTE)/云母、OTE/SiO_2和SiO_2对氮化硅原子力显微镜/摩擦力显微镜针尖进行原位化学修饰的实验结果。与改性前相比，改性后的针尖与云母参考样品具有不同的摩擦和粘结性能。由此产生的针尖修饰不仅依赖于OTE自组装单分子膜(SAM)，而且还依赖于制备OTE SAM的衬底。在OTE/云母的情况下，改性针尖相对于云母基准的摩擦力大大降低；在OTE/SiO_2的情况下，改性针尖相对于云母基准的摩擦力大大增加。令人惊讶的是，裸SiO_2还可以对Si3N4针尖进行化学修饰，以增加与云母参照物的摩擦。在OTE改性的情况下，发现可以通过在云母上重复摩擦扫描来清洁尖端。然而，SiO_2改性的尖端不能机械凝固。
In this paper, we present our experimental results on the process of the in situ chemical modification of the silicon nitride atomic force microscopy/frictional force microscopy tip by n-octadecyltrimethoxysilane (OTE)/mica, OTE/SiO2, and SiO2. The modified tips have different friction and adhesion properties against mica reference samples compared to those before modification. The resultant tip modification depends not only on OTE self-assembled monolayer (SAM) but also on the substrates the OTE SAM is prepared on. In the case of OTE/mica, the friction of the modified tip against mica reference is greatly reduced; in the case of OTE/SiO2, the friction of the modified tip against mica reference is greatly increased. It is surprising that bare SiO2 can also chemically modify the Si3N4 tip to increase the friction against mica reference. In the case of OTE modification, it was found that the tips could be cleaned by repetitive friction scans on mica. However, a tip modified by SiO2 cannot be mechanically cl...