Coexistence of metallic and insulating phases in epitaxial CaRuO3 thin films observed by scanning microwave microscopy
Coexistence of metallic and insulating phases in epitaxial CaRuO3 thin films observed by scanning microwave microscopy
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扫描微波显微镜观察外延CaRuO3薄膜中金属相和绝缘相的共存
DOI：
10.1063/1.1448391
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发表时间：
2002
影响因子：
4
通讯作者：
K. Char
中科院分区：
文献类型：
--
作者：
S. Hyun;Jaehee Cho;A. Kim;Jurae Kim;T. Kim;K. Char
使用扫描微波显微镜，我们研究了局域电性能的外延CaRuO 3薄膜。薄膜表现出金属-绝缘体的转变取决于生长温度和它们的厚度。我们观察到在800 °C的高温下生长的薄膜中空间分离的高导电和低导电区域，这显示出绝缘行为。 在具有绝缘行为的CaRuO 3薄膜中的导电是通过高导电区域的扩散性的，并且与这种两相行为密切相关。
Using a scanning microwave microscope, we investigated the local electrical properties of epitaxial CaRuO3 thin films. The films showed a metal–insulator transition depending on the growth temperature and their thickness. We observed spatially separated highly conducting and poorly conducting regions in the films grown at a high temperature of 800 °C, which showed insulating behavior. The conduction in the CaRuO3 thin films with insulating behavior is percolative through the highly conducting regions and is closely related to this two-phase behavior.