Data-driven self-timed RSFQ high-speed test system
Data-driven self-timed RSFQ high-speed test system
复制标题
数据驱动的自定时RSFQ高速测试系统
DOI：
10.1109/77.659434
复制
发表时间：
1997
影响因子：
1.8
通讯作者：
T. Van Duzer
中科院分区：
文献类型：
--
作者：
Z. J. Deng;N. Yoshikawa;S. Whiteley;T. Van Duzer
为了进一步优化电路设计，对快速单通量量子(RSFQ)逻辑电路进行高速功能测试是必要的，但由于快速单通量量子(SFQ)脉冲的速度快、幅值小，进行片外测试并非易事。介绍了一种基于数据驱动自定时电路的20 Gb/S逐位片上高速数字测试系统的设计和测试结果。
Functional testing of rapid single-flux-quantum (RSFQ) logic circuits at high speed is necessary to further optimize circuit design, but it is not easy to do off-chip testing because of the high speed and small amplitude of SFQ pulses. This paper will present the design and test results of an 20 Gb/s bit-by-bit on-chip high-speed digital test system based on data-driven self-timed (DDST) circuits.