Methods for Conducting Electron Backscattered Diffraction (EBSD) on Polycrystalline Organic Molecular Thin Films

Methods for Conducting Electron Backscattered Diffraction (EBSD) on Polycrystalline Organic Molecular Thin Films
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DOI:
10.1017/s1431927618000442
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发表时间:
2018-08-01
影响因子:
2.8
通讯作者:
Avishai, Amir
Avishai, Amir
中科院分区:
工程技术4区
文献类型:
--
作者:
Abbasi, Kevin;Wang, Danqi;Avishai, Amir

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电子背散射衍射(EBSD)是一种常用的从无机样品中获取结晶学信息的技术。当EBSD与发射二极管数据同时获得时,样品可以在结构和成分上得到彻底的表征。对于有机材料,当电子束与晶体材料相互作用时,确实会形成相干菊池图案。然而,由于有机材料的平均原子序数较低,这种图案往往很弱。此外,一旦超过临界电子剂量,这些图案就会迅速褪色并完全消失,从而阻碍了从它们那里成功地收集EBSD地图。在这项研究中,提出了一种新的方法,可以成功地从有机材料中收集EBSD图,这里是碳氢化合物有机分子薄膜的极端例子,并为结晶有机材料的表征开辟了新的途径。
Electron backscattered diffraction (EBSD) is a technique regularly used to obtain crystallographic information from inorganic samples. When EBSD is acquired simultaneously with emitting diodes data, a sample can be thoroughly characterized both structurally and compositionally. For organic materials, coherent Kikuchi patterns do form when the electron beam interacts with crystalline material. However, such patterns tend to be weak due to the low average atomic number of organic materials. This is compounded by the fact that the patterns fade quickly and disappear completely once a critical electron dose is exceeded, inhibiting successful collection of EBSD maps from them. In this study, a new approach is presented that allows successful collection of EBSD maps from organic materials, here the extreme example of a hydrocarbon organic molecular thin film, and opens new avenues of characterization for crystalline organic materials.