Theoretical study of stubs for power line noise reduction [LSI applications]
Theoretical study of stubs for power line noise reduction [LSI applications]
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用于降低电源线噪声的短截线的理论研究[LSI应用]
DOI：
10.1109/cicc.2003.1249493
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发表时间：
2003
期刊：
影响因子：
--
通讯作者：
K. Asada
中科院分区：
文献类型：
--
作者：
T. Nakura;M. Ikeda;K. Asada
本文介绍了一种di/dt降噪方法，该方法在LSI芯片的电源线上附加插脚。在2.5 GHz 1.8 V工作测试电路中，研究了有损耗的传输线短管的理论模型，仿真结果表明，与不附加短管和去耦合电容的情况相比，带短管的传输线能分别降低48%和26%的噪声。研究还表明，该方法将更有效地用于进一步的高频操作芯片。
This paper describes a di/dt noise reduction method, which attaches stubs to the power line in LSI chips. A theoretical model of a lossy transmission line stub is investigated, and simulation results show that the stub can reduce 48% and 26% of the noise compared with the non stub-attached case, and de-coupling capacitor case, respectively, in a 2.5 GHz 1.8 V operation test circuit. It is also shown that this method will work more efficiently for further high frequency operation chips.