Characteristic changes of deuterium retention on tungsten surfaces due to low-energy helium plasma pre-exposure

Characteristic changes of deuterium retention on tungsten surfaces due to low-energy helium plasma pre-exposure
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DOI:
10.1016/j.jnucmat.2004.10.011
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发表时间:
2005-03
影响因子:
3.1
通讯作者:
D. Nishijima;T. Sugimoto;H. Iwakiri;M. Ye;N. Ohno;N. Yoshida;S. Takamura
D. Nishijima;T. Sugimoto;H. Iwakiri;M. Ye;N. Ohno;N. Yoshida;S. Takamura
中科院分区:
工程技术2区
文献类型:
--
作者:
D. Nishijima;T. Sugimoto;H. Iwakiri;M. Ye;N. Ohno;N. Yoshida;S. Takamura

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当钨在高温(1600 K)下预暴露于低能He等离子体时,钨中的氘保留量大幅增加,而在低温(700 K)下预暴露时,氘保留量减少。氘保留率的增加可归因于在钨表面上形成的亚微米尺寸的He气泡和二次间隙缺陷。在低温He预暴露过程中He原子对陷阱位的占据会减少氘原子的有效陷阱位数,这将降低氘在钨表面上的保留。
Deuterium retention in tungsten increases substantially when it is pre-exposed to low-energy He plasma at a high temperature (1600K), while it decreases when pre-exposed at a low temperature (700K). The increase of deuterium retention could be attributed to the submicron-sized He bubbles and secondary interstitial defects formed on the tungsten surface. Occupation of trap sites by He atoms during the He pre-exposure at low temperature could decreases the effective number of available trap sites for deuterium atoms, which would decreases the deuterium retention on the tungsten surface.