Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratio
Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratio
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DOI：
10.1016/j.ultramic.2020.113133
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发表时间：
2021-01-01
期刊：
影响因子：
2.2
通讯作者：
Shibata, Naoya
中科院分区：
文献类型：
--
作者：
Ooe, Kousuke;Seki, Takehito;Shibata, Naoya
束敏感材料的原子分辨率低剂量成像是电子显微学研究中最具挑战性的课题之一。在这项研究中，我们从理论上开发了一种新的扫描透射电子显微镜（STEM）成像技术，通过最大限度地提高信号-噪声比下的弱相位对象近似（WPOA），我们将调用最佳明场（OBF）成像的图像。OBF图像是通过处理由分段/像素化检测器通过复频率滤波获取的多个图像来获得的。该方法已通过系统的图像模拟被证实是高度剂量效率的。此外，我们实验证明了高剂量效率的OBF技术通过可视化的原子结构中的锂离子电池材料，使用高速分段检测器。此外，它表明，OBF成像是可用于实时成像，这使得低剂量的观察束敏感材料更容易实现。
Atomic-resolution low-dose imaging for beam-sensitive materials is one of the most challenging topics in electron microscopy research. In this study, we theoretically developed a new scanning transmission electron microscopy (STEM) imaging technique by maximizing the signal-to-noise ratio of an obtainable image under the weak phase object approximation (WPOA), which we will call optimum bright-field (OBF) imaging. OBF images are obtained by processing multiple images acquired by segmented/pixelated detectors through complex frequency filtering. This method has been confirmed through a systematic image simulation to be highly dose-efficient. Furthermore, we experimentally demonstrate the high dose efficiency of the OBF technique by visualizing the atomic structure in a lithium-ion battery material using a high-speed segmented detector. Furthermore, it was shown that OBF imaging is usable for real-time imaging, which makes low-dose observations of beam-sensitive materials much easier to achieve.