Security vs. test quality: fully embedded test approaches are the key to having both
Security vs. test quality: fully embedded test approaches are the key to having both
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安全性与测试质量：完全嵌入式测试方法是同时拥有这两者的关键
DOI：
10.1109/itc.2004.160
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发表时间：
2004
期刊：
影响因子：
--
通讯作者：
S. Pateras
中科院分区：
文献类型：
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作者：
S. Pateras
在过去的几年中，全嵌入式高速结构测试方法的使用越来越多。对于随机逻辑测试，全扫描ATPG方法提供了一个完整的外部测试方法。最近基于ATPG压缩的方法代表了一种混合方法，包括一些内部IP和减少的外部扫描测试数据。最后，逻辑BIST方法代表了一种完全嵌入的测试方法，不需要外部测试数据。嵌入式测试提供了两个不同的安全性优势。第一个好处是知识产权保护。另一个安全问题是，一旦设备在现场激活，就可以访问存储在设备内的敏感数据。
Fully embedded at-speed structural test approaches are growing in use over the past several years. For random logic testing, the full scan ATPG methodology provides a fully external test approach. The more recent ATPG compression based methodologies represent a hybrid approach consisting of some internal IP as well as reduced external scan test data. Finally the logic BIST methodology represents a fully embedded test approach requiring no external test data. The embedded test provides two distinct security benefits. The first of these benefits is IP protection. The other security issue is access to sensitive data stored inside the device once it is active in the field.