VHDL Implementation of GCD Processor with Built in Self Test Feature
VHDL Implementation of GCD Processor with Built in Self Test Feature
复制标题
具有内置自测试功能的 GCD 处理器的 VHDL 实现
DOI：
10.5120/3000-4034
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
S. Mandeep
中科院分区：
文献类型：
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作者：
Devi Rekha;Singh Jaget;S. Mandeep
超大规模集成电路（VLSI）对数字技术的发展产生了巨大影响。VLSI不仅缩小了尺寸和成本，而且增加了电路的复杂性。随着集成规模的扩大，电路测试也变得越来越困难。这个问题的一个解决方案是在集成电路中添加逻辑，这样它就可以进行自我测试。本文在VHDL语言中设计了具有BIST功能的GCD（最大共分配器）处理器，并比较了带和不带BIST的面积开销。
The Very Large Scale Integration (VLSI) has a dramatic impact on the growth of digital technology. VLSI has not only reduced the size and the cost, but also increased the complexity of the circuits. Due increase there is a problem of circuit testing, which becomes increasingly difficult as the scale of integration grows. One solution to this problem is to add logic to the IC so that it can test itself. In this paper we have design GCD (greatest common divider) processors in VHDL with BIST capability and compared the area overhead of with and without BIST.