Sub-millimeter wave planar near-field antenna testing
Sub-millimeter wave planar near-field antenna testing
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亚毫米波平面近场天线测试
DOI：
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发表时间：
2009
期刊：
影响因子：
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通讯作者：
G. Hindman
中科院分区：
文献类型：
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作者：
D. V. van Rensburg;G. Hindman
本文概述了为亚毫米波测试开发的平面近场天线测试系统。介绍了为克服通常限制极高射频频率性能的技术限制而开发的特殊技术。解决了热结构变化、射频电缆相位不稳定性、扫描仪平面性和偏振旋转期间探头平移等问题。这些方法已在高达 660 GHz 和 950 GHz 的系统上实施和验证。这些案例促进了低成本商业测试系统的开发，使 V 和 W 频段 (40 – 110 GHz) 的天线测试具有成本效益。
This paper provides an overview of planar near-field antenna test systems developed for sub-millimeter wave testing. Special techniques that have been developed to overcome technical restrictions that usually limit performance at very high RF frequencies are presented. Aspects like thermal structural change, RF cable phase instability, scanner planarity and probe translation during polarization rotation are addressed. These methods have been implemented and validated on systems up to 660 GHz and 950 GHz. These cases have lead to the development of low cost commercial test systems, making antenna testing in the V and W-bands (40 – 110 GHz) cost effective.