Oxidation of Copper between 250° and 450°C and the Growth of CuO “Whiskers”
Oxidation of Copper between 250° and 450°C and the Growth of CuO “Whiskers”
复制标题
250° 至 450°C 期间铜的氧化以及 CuO“晶须”的生长
DOI:
10.1149/1.2428024
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发表时间:
1961
影响因子:
3.9
通讯作者:
K. Andrew
中科院分区:
文献类型:
--
作者:
E. A. Gulbransen;T. P. Copan;K. Andrew
Thin oxide whiskers have been found to grow on copper by a number of investigators. The relation of these growths to the mechanism of oxidation and to changes in the kinetics of oxidation remains to be established. To answer these questions a study was made of the oxidation of copper using the vacuum microbalance method to determine the kinetics of reaction, x-ray and electron diffraction methods for study of the oxide crystal structures, and a high resolution electron microscope to determine the size and surface density of the oxide whiskers.The results show that the oxidation of copper follows the cubic rate law between 250 and 450~ Small embryonic whiskers are formed at 250~ and 6 hr of reaction. A surface density of 108/cm 2 of long thin oxide whiskers was found at 450~ after 6 hr of oxidation. Less than 1% of the oxygen reacting with the metal at 450~ resulted in the growth of oxide whiskers. We conclude on the basis of the cubic rate law plots and analyses of the whiskers size and density that the formation of oxide whiskers, although of great interest as a natural phenomena, had no appreciable effect on the kinetics of the oxidation process.