The noise of membrane capacitance measurements in the whole-cell recording configuration
The noise of membrane capacitance measurements in the whole-cell recording configuration
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DOI：
10.1016/s0006-3495(00)76464-2
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发表时间：
2000-10-01
影响因子：
3.4
通讯作者：
Gillis, KD
中科院分区：
文献类型：
--
作者：
Chen, P;Gillis, KD
在全细胞记录配置中的膜电容的高分辨率测量可以用于检测伴随胞吐和胞吞的膜表面积的微小变化。我们已经研究了膜电容测量的噪声，以确定在全细胞模式中实际细胞中分辨率的基本限制。两个以前被忽视的噪声源在低频时特别明显。第一个噪声源伴随着电容估计值之间的相关性，而第二个噪声源是由于“1/f类”电流噪声。一个解析表达式，总结了从热和1/f源的噪声推导出，这与实验测量实际细胞在一个大的频率范围内。我们的研究结果表明，电容测量的最佳频率比以前认为的要高。最后，我们证明了在高频下的电容噪声可以通过补偿串联电阻两端的正弦波的电压降来降低。
High-resolution measurement of membrane capacitance in the whole-cell-recording configuration can be used to detect small changes in membrane surface area that accompany exocytosis and endocytosis, We have investigated the noise of membrane capacitance measurements to determine the fundamental limits of resolution in actual cells in the whole-cell mode. Two previously overlooked sources of noise are particularly evident at low frequencies. The first noise source is accompanied by a correlation between capacitance estimates, whereas the second noise source is due to "1/f-like" current noise. An analytic expression that summarizes the noise from thermal and 1/f sources is derived, which agrees with experimental measurements from actual cells over a large frequency range. Our results demonstrate that the optimal frequencies for capacitance measurements are higher than previously believed. Finally, we demonstrate that the capacitance noise at high frequencies can be reduced by compensating for the voltage drop of the sine wave across the series resistance.