Inverse Design of High Absorption Thin-Film Photovoltaic Materials
Inverse Design of High Absorption Thin-Film Photovoltaic Materials
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DOI:
10.1002/aenm.201200538
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发表时间:
2013-01-01
影响因子:
27.8
通讯作者:
Zunger, Alex
中科院分区:
文献类型:
--
作者:
Yu, Liping;Kokenyesi, Robert S.;Zunger, Alex
Enhancement of photocarrier collection by aiding drift through a very thin inorganic absorber film represents a promising route to new, high-efficiency photovoltaic (PV) devices.[1] The realization of such devices is largely predicated on the availability of materials that exhibit strong absorption across the solar spectrum with an abrupt onset at the band gap. Such materials have direct band gaps, but not all direct-band-gap materials are strong absorbers. Currently, ternary I-III-VI 2 chalcogenides, typified by CuInSe 2, are among the strong direct band-gap absorbers known, establishing the basis for a commercial thinfilm solar cell technology. While overall absorption is strong, the measured weak onset absorption near the band gap necessitates the use of rather thick films (∼ 1.5 μm).[2] This thickness coupled with the relatively low abundance of In (In/Si= 10− 7) potentially limits the scalability of this technology to the terawatt level.[3] Clearly, opportunities exist for advancing state-ofthe-art thin-film PV through identification and design of new, strongly absorbing materials. However, there are currently no guiding rules (“design principles”) that reveal the physical factors distinguishing strong from moderate or weak direct-bandgap absorbers. In this work, we present a fundamental analysis of the factors that control absorption strength in compound semiconductors. From this analysis, we develop new insights into “absorption design principles”, propose candidate, highly absorbing materials, and experimentally assess their absorption properties.Identification and design of the needed materials requires an approach beyond the classic one-dimensional Shockley-Queisser criterion,[4] which selects good PV absorbers solely on the basis of their band gap (direct or indirect) being in the range of 1.0− 1.5 eV. This simple one-dimensional metric does not represent material-dependent optical absorption spectra and related radiative/nonradiative recombination losses, which are essential for evaluating a semiconductor as a thin-film absorber. Recently, we have proposed a new and improved