TEM study on deuterium-irradiation-induced defects in tungsten and molybdenum
TEM study on deuterium-irradiation-induced defects in tungsten and molybdenum
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DOI：
10.1016/s0022-3115(00)00169-0
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发表时间：
2000-12
影响因子：
3.1
通讯作者：
T. Matsui;S. Muto;T. Tanabe
中科院分区：
文献类型：
--
作者：
T. Matsui;S. Muto;T. Tanabe
用透射电子显微镜观察了金属钨(W)和钼(Mo)中的氚辐照缺陷。观察到的缺陷是具有a/2〈1 1 1〉类型的Burgers矢量的填充型完美位错环。循环平面具有几乎平行于{1 1 0}平面的非整数米勒索引。在高压电子显微镜中，用1 MeV电子对W进行进一步辐照时，观察到了随后的位错环生长。这种生长归因于SIA-D复合体(SIA：自间隙原子，D：氢)的解离和随后释放的间隙原子被附近的位错环吸收。
Deuterium-irradiation-induced defects in tungsten (W) and molybdenum (Mo) were examined by transmission electron microscopy (TEM). The observed defects were perfect dislocation loops of interstitial type with the Burgers vector of a/2 〈1 1 1〉 type. The loop plane has non-integer Miller indices nearly parallel to the {1 1 0} plane. Subsequent growth of some dislocation loops was observed during further irradiation with W by post-irradiation of 1 MeV electrons in a high-voltage electron microscope. This growth is ascribed to the dissociation of SIA-D complexes (SIA: self-interstitial atom, D: deuterium) and subsequent absorption of the released interstitial atoms by nearby dislocation loops.