Contact resonance atomic force microscopy using long elastic tips

Contact resonance atomic force microscopy using long elastic tips
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DOI:
10.1088/1361-6528/ad0bd2
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发表时间:
2024-02-12
期刊:
影响因子:
3.5
通讯作者:
Tung,Ryan C.
Tung,Ryan C.
中科院分区:
材料科学3区
文献类型:
--
作者:
Zimron-Politi,Nadav;Tung,Ryan C.

文献摘要

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在这项工作中,接触共振原子力显微镜,它结合了一个长的传感尖端的弹性动力学的一个新的理论模型。该模型是基于欧拉-伯努利梁理论,并包括耦合效应的双梁结构,也被称为一个'L形'梁在文献中。在这里,高精度的预测样品的刚度,使用几个振动模式的相对误差小于10%的实际工作范围内,被证明。该模型的能力来预测的本征模式转向和交叉的动态现象的讨论,施加到样品的力的增加,提出。本文提出的L形梁模型也适用于结构应用,如:微机电系统,能量收集和无人机起落架。
In this work, a new theoretical model for contact resonance atomic force microscopy, which incorporates the elastic dynamics of a long sensing tip is presented. The model is based on the Euler–Bernoulli beam theory and includes coupling effects from the two-beam structure, also known as an'L-shaped'beam in the literature. Here, high-accuracy prediction of the sample stiffness, using several vibration modes with a relative error smaller than 10% for practical working ranges, is demonstrated. A discussion on the model's capability to predict the dynamic phenomena of eigenmode veering and crossing, as the force applied to the sample increases, is presented. The L-shaped beam model presented here is also applicable for structural applications such as: micro-electro-mechanical systems, energy harvesting, and unmanned aerial vehicle landing gear.