Contact resonance atomic force microscopy using long elastic tips
Contact resonance atomic force microscopy using long elastic tips
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DOI:
10.1088/1361-6528/ad0bd2
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发表时间:
2024-02-12
期刊:
影响因子:
3.5
通讯作者:
Tung,Ryan C.
中科院分区:
文献类型:
--
作者:
Zimron-Politi,Nadav;Tung,Ryan C.
In this work, a new theoretical model for contact resonance atomic force microscopy, which incorporates the elastic dynamics of a long sensing tip is presented. The model is based on the Euler–Bernoulli beam theory and includes coupling effects from the two-beam structure, also known as an'L-shaped'beam in the literature. Here, high-accuracy prediction of the sample stiffness, using several vibration modes with a relative error smaller than 10% for practical working ranges, is demonstrated. A discussion on the model's capability to predict the dynamic phenomena of eigenmode veering and crossing, as the force applied to the sample increases, is presented. The L-shaped beam model presented here is also applicable for structural applications such as: micro-electro-mechanical systems, energy harvesting, and unmanned aerial vehicle landing gear.