(Re-)crystallization mechanism of highly oriented Si-microwire arrays by TEM analysis
(Re-)crystallization mechanism of highly oriented Si-microwire arrays by TEM analysis
复制标题
通过 TEM 分析高度取向硅微线阵列的（重）结晶机制
DOI：
10.1007/s10008-017-3672-6
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发表时间：
--
影响因子：
2.5
通讯作者：
L. Kienle
中科院分区：
文献类型：
--
作者：
G. Neubüser;S. Hansen;V. Duppel;R. Adelung;L. Kienle
新型锂离子电池负极的特征在于透射电子显微镜（TEM）。阳极由通过受控蚀刻工艺从传统硅晶片获得的有序硅微线阵列组成。合适的制备方法的线在微米范围内进行了测试，优化，并随后应用。非原位TEM测量已经进行了原始的，以及电化学循环的电线，已被充电和放电了几次。研究了循环速率、电解质添加剂以及高温对阳极稳定性的影响。
Novel anodes for Li-ion batteries have been characterized by transmission electron microscopy (TEM). The anodes consist of arrays of ordered silicon microwires obtained from conventional silicon wafers by controlled etching processes. Suitable preparation methods for wires in the micrometer range have been tested, optimized, and subsequently applied. Ex situ TEM measurements have been performed for pristine as well as for electrochemically cycled wires that have been charged and discharged for several times. The influences of cycling rate, an electrolyte additive, as well as elevated temperatures on the anodes’ stability have been investigated.
影响因子：
6.6
作者：
Hansen, Sandra;Quiroga-Gonzalez, Enrique;Foell, Helmut
通讯作者：
Foell, Helmut