30 years of small‐angle x‐ray scattering

30 years of small‐angle x‐ray scattering
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DOI:
10.1063/1.3035251
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发表时间:
1969-11
期刊:
影响因子:
3.5
通讯作者:
A. Guinier
A. Guinier
中科院分区:
物理与天体物理4区
文献类型:
--
作者:
A. Guinier

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小角X射线衍射研究的实验和理论进展都始于大约30年前。利用聚焦晶体单色仪,实验人员可以获得他们需要的强度和分辨率,以分辨靠近主光束的衍射图。现在有许多其他方法可以用来研究这种散射。而形状因子概念在散射理论中的应用为引起这种散射的小颗粒的平均尺寸和形状提供了一种统计度量。
EXPERIMENTAL AND THEORETICAL advances in the study of x‐ray diffraction at small angles both started about 30 years ago. With the focusing crystal monochromator experimenters could obtain the intensity and resolution they needed to resolve the diffraction pattern close to the primary beam. Now many other methods allow a study of this kind of scattering. And application of the form‐factor concept in scattering theory provided a statistical measure for the average size and shape of the small grains that are responsible for this kind of scattering.