Characterization of ultrathin poly(ethylene glycol) monolayers on silicon substrates
Characterization of ultrathin poly(ethylene glycol) monolayers on silicon substrates
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DOI：
10.1021/la000609d
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发表时间：
2001-03-06
期刊：
影响因子：
3.9
通讯作者：
Larsen, NB
中科院分区：
文献类型：
--
作者：
Papra, A;Gadegaard, N;Larsen, NB
低分子量聚乙二醇硅烷(聚乙二醇硅烷)通过一步法被接枝到硅片表面，得到超薄且稳定的聚乙二醇单分子膜。通过X射线反射率的结构研究提供了关于聚乙二醇单分子膜厚度的数据。根据施加的聚乙二醇硅烷浓度的不同，层厚在10到17A之间变化。这些结果得到了X射线光电子能谱测量的证实，原子力显微镜数据表明，覆盖层非常光滑和均匀，粗糙度小于3埃。聚乙二醇层是亲水性的，其推进水接触角在36度到39度之间。
Low molecular weight poly(ethylene glycol) silanes (PEG silanes) have been grafted onto the surface of silicon wafers in a one-step procedure yielding ultrathin and stable PEG monolayers. Structural investigation by means of X-ray reflectivity provided data on the thickness of the PEG monolayers. The layer thickness varied between 10 and 17 A depending on the PEG silane concentration applied. These results have been confirmed by X-ray photoelectron spectroscopy measurements Atomic force microscopy data indicate very smooth and homogeneous coverages with roughnesses of less than 3 Angstrom . The PEG layers are hydrophilic as determined with advancing water contact angles between 36 and 39 degrees.