Energy Dispersive Diffraction Stress Analysis under Laboratory and Synchrotron Conditions a Comparative Study
Energy Dispersive Diffraction Stress Analysis under Laboratory and Synchrotron Conditions a Comparative Study
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实验室和同步加速器条件下的能量色散衍射应力分析比较研究
DOI：
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
I. Denks
中科院分区：
文献类型：
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作者：
C. Genzel;S. Krahmer;M. Klaus;I. Denks
为了在实验室条件下进行能量色散残余应力分析的可行性研究，目前工作在角色散衍射模式下的X射线衍射仪配备了一根商用钨管和一台能量色散固态锗探测器。系统地研究了不同材料的近表面残余应力状态，从几何分辨率、测量时间和稳定性三个方面对不同材料进行了表征。用改进后的实验室设备在合理的测量时间内获得的结果与在相同样品上进行的同步加速器测量结果非常一致。以表面残余应力分布高度不均匀的Al_2O_3陶瓷为例，进一步证明了实验室和同步加速器测量用的衍射计体积的不同大小和形状可能对实验获得的拉普拉斯空间残余应力深度分布有显着影响(σ||(τ)。
For a feasibility study of energy-dispersive residual stress analysis under laboratory conditions, an X-ray diffractometer that has been operated so far in the angle dispersive diffraction mode was equipped with a commercial tungsten tube and an energy-dispersive solid-state germanium detector. Starting from systematic investigations to find the optimum configuration regarding geometrical resolution, measuring time and stability of the applied detector system, different materials were characterized with respect to the near-surface residual stress state. The results achieved with the modified laboratory equipment within reasonable measuring times are in good agreement with synchrotron measurements performed on the same samples. With the example of a shot-peened Al2O3 ceramic with a highly non-uniform near-surface residual stress distribution it is furthermore shown that the different size and shape of the diffracting gauge volume used for the laboratory and synchrotron measurements might have a significant influence on the experimentally obtained Laplace-space residual stress depth profiles σ||(τ).