Optimized analysis of imaging time‐of‐flight SIMS data
Optimized analysis of imaging time‐of‐flight SIMS data
复制标题
成像飞行时间 SIMS 数据的优化分析
DOI：
10.1002/sia.5059
复制
发表时间：
2013
影响因子：
1.7
通讯作者：
A. Walker
中科院分区：
文献类型：
--
作者：
L. Gelb;Tammy M. Millilo;A. Walker
我们介绍了从成像质谱学数据中定量提取化学浓度分布、组分光谱、样品形貌和其他信息的进展。我们的方法是基于天文学、计算机视觉、高光谱成像和其他领域中使用的最大后验图像重建。我们为样品提出了一个简单但可扩展的非线性模型，包括每个组分的浓度分布、形貌、组分质量谱以及描述组分之间相互作用的“相互作用谱”。该模型利用随机优化技术对样本数据进行了拟合。这种方法可以自然地包括正则化、化学结构识别和与标准参考数据的匹配。在这篇文章中，我们提供了飞行时间二次离子质谱仪(TOF SIMS)图像的初步分析，并讨论了该方法的进一步扩展。版权所有©2012 John Wiley&Sons，Ltd.
We present progress toward the quantitative extraction of chemical concentration profiles, component spectra, sample topography, and other information from imaging mass spectrometry data. Our approach is based on maximum a posteriori image reconstruction as used in astronomy, computer vision, hyperspectral imaging, and other fields. We propose a simple but extensible nonlinear model for the sample, consisting of concentration profiles for each component, topography, component mass spectra, and “interaction spectra” that describe the interactions between components. This model is fit against sample data using stochastic optimization techniques. This approach can naturally incorporate regularization, chemical structure identification, and matching against standard reference data. In this article, we present preliminary analyses of time‐of‐flight secondary ion mass spectrometry (TOF SIMS) images of a well‐characterized reference sample and discuss further extensions of this approach. Copyright © 2012 John Wiley & Sons, Ltd.