Recent advances in edge illumination x-ray phase-contrast tomography.
Recent advances in edge illumination x-ray phase-contrast tomography.
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DOI：
10.1117/1.jmi.4.4.040901
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发表时间：
2017-10
期刊：
影响因子：
--
通讯作者：
Olivo A
中科院分区：
文献类型：
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作者：
Zamir A;Hagen C;Diemoz PC;Endrizzi M;Vittoria F;Chen Y;Anastasio MA;Olivo A
边缘照明（EI）是一种X射线相位衬度成像技术，它利用对X射线折射的敏感性来使一些特征可视化，这些特征通常是传统的基于吸收的射线照相术无法检测到的。该方法不需要高度的空间相干性，并且是消色差的，因此，它既可以用同步辐射也可以用商用X射线管来实现。使用不同的反演算法，可以获得关于物体的衰减、折射和散射特性的信息。近年来，一个理论框架已经被建立起来，它使EI计算机断层扫描（CT）成为可能，从而实现三维成像。这篇综述总结了这些进展，涵盖了不同的图像采集方案、反演方法和应用的发展。这些发展是EI CT转变为一种在众多领域广泛使用的成像工具的一个不可或缺的部分。
Edge illumination (EI) is an x-ray phase-contrast imaging technique, exploiting sensitivity to x-ray refraction to visualize features, which are often not detected by conventional absorption-based radiography. The method does not require a high degree of spatial coherence and is achromatic and, therefore, can be implemented with both synchrotron radiation and commercial x-ray tubes. Using different retrieval algorithms, information about an object’s attenuation, refraction, and scattering properties can be obtained. In recent years, a theoretical framework has been developed that enables EI computed tomography (CT) and, hence, three-dimensional imaging. This review provides a summary of these advances, covering the development of different image acquisition schemes, retrieval approaches, and applications. These developments constitute an integral part in the transformation of EI CT into a widely spread imaging tool for use in a range of fields.