^-REGULARITY, TEST ELEMENTS, AND SMOOTH BASE CHANGE
^-REGULARITY, TEST ELEMENTS, AND SMOOTH BASE CHANGE
复制标题
^-规律性、测试元素和平滑的基础变化
DOI:
10.1078/1439-6092-00057
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发表时间:
2010
影响因子:
1.6
通讯作者:
C. Huneke
中科院分区:
文献类型:
--
作者:
M. Hochster;C. Huneke
This paper deals with tight closure theory in positive characteristic. After a good deal of preliminary work in the first five sections, including a treatment of F-rationality and a treatment of F-regularity for Gorenstein rings, a very widely applicable theory of test elements for tight closure is developed in §6 and is then applied in §7 to prove that both tight closure and F-regularity commute with smooth base change under many circumstances (where "smooth" is used to mean flat with geometrically regular fibers). For example, it is shown in §6 that for a reduced ring R essentially of finite type over an excellent local ring of characteristic p , if c is not in any minimal prime of R and Rc is regular, then c has a power that is a test element. It is shown in §7 that if S is a flat /{-algebra with regular fibers and R is F-regular then S is F-regular. The general problem of showing that tight closure commutes with smooth base change remains open, but is reduced here to showing that tight closure commutes with localization.