Thermoactivation spectroscopy of solid Ar doped with N
Thermoactivation spectroscopy of solid Ar doped with N
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N掺杂固体Ar的热活化光谱
DOI：
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发表时间：
2007
期刊：
影响因子：
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通讯作者：
V. Bondybey
中科院分区：
文献类型：
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作者：
A. Ponomaryov;E. Savchenko;I. V. Khizhniy;G. Gumenchuk;M. Frankowski;V. Bondybey
开发了一种新的低温活化光谱技术，用于低温固体弛豫过程的实时相关研究。这使我们能够同时测量 200 至 1100 nm 范围内的热受激外电子发射 (TSEE) 和光谱分辨热受激发光 (TSL)。本文介绍了掺杂 N2 的固体 Ar 在沉积过程中受到低能电子束 (500eV) 照射的 TSL 和 TSEE 结果。 TSEE和TSL产率是在3.2K/min的加热速率下测量的。研究了 TSL 光谱中分子（A3Σu+→X1Σg+ 跃迁）和原子（D2→S4 跃迁）氮的发射及其温度行为。随着温度升高，观察到分子级数强度分布的剧烈变化。在低温范围内，检测到“热”振动不松弛跃迁，与“高”温 TSL 中观察到的“冷”振动松弛跃迁形成鲜明对比……
A new modification of low-temperature activation spectroscopy technique for real-time correlated study of relaxation processes in cryogenic solids is developed. This enables us to measure simultaneously the thermally stimulated exoelectron emission (TSEE) and spectrally resolved thermally stimulated luminescence (TSL) in the range from 200 to 1100nm. This paper presents the results on TSL and TSEE from solid Ar doped with N2 exposed to irradiation by a low-energy electron beam (500eV) during deposition. The TSEE and TSL yields were measured at a heating rate of 3.2K∕min. The emissions of molecular (A3Σu+→X1Σg+ transition) and atomic (D2→S4 transition) nitrogen in the TSL spectra and their temperature behavior were studied. Drastic changes in the intensity distribution of the molecular progression are observed with temperature rise. In the low-temperature range, “hot” vibrationally unrelaxed transitions are detected, in contrast to “cold” vibrationally relaxed transitions observed in “high”-temperature TSL...