Observation of a liquid-to-layered transition in thin liquid films when surface and interface regions overlap.
Observation of a liquid-to-layered transition in thin liquid films when surface and interface regions overlap.
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当表面和界面区域重叠时，观察薄液膜中的液体到层状的转变。
DOI：
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发表时间：
2008
期刊：
影响因子：
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通讯作者：
Chung
中科院分区：
文献类型：
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作者：
D. R. Lee;P. Dutta;Chung
我们用X射线反射率研究了分子薄的正常液体[四(2-乙基己氧基)硅烷(TEHOS)]中表面和界面分层的耦合，它是温度和薄膜厚度的函数。由均匀密度分量叠加在分子尺度密度振荡(层)上的电子密度模型获得了与数据的最佳拟合。在187-286K温度范围内，观察到两种不同类型的层分布随温度变化。分子层中的物质含量随着均匀密度层中物质含量的减少而增加，在总薄膜厚度约为40A(约为TEHOS整体关联长度的两倍)时发生液体-层状转变。
We have used x-ray reflectivity to study the coupling of surface and interface layering in a molecularly thin normal liquid [tetrakis(2-ethylhexoxy)silane (TEHOS)], as a function of temperature and film thickness. The best fits to the data were obtained with an electron density model that consists of a uniform density component superimposed upon molecular-scale density oscillations (layers). The two types of layer profiles were observed to vary with temperature from 187-286 K . The amount of material in the molecular layers increases as that in the uniform density layer decreases, with the onset of liquid-to-layered transition occurring at a total film thickness of approximately 40 A (about twice the bulk correlation length of TEHOS).