Robotic dual probe setup for reliable pick and place processing on the nanoscale using haptic devices
Robotic dual probe setup for reliable pick and place processing on the nanoscale using haptic devices
复制标题
DOI：
10.1109/iros.2014.6942665
复制
发表时间：
2014-11
期刊：
影响因子：
--
通讯作者：
Tobias Tiemerding;S. Zimmermann;S. Fatikow
中科院分区：
文献类型：
--
作者：
Tobias Tiemerding;S. Zimmermann;S. Fatikow
本文介绍了可重复的拾取和放置处理的颗粒在亚微米范围内。该处理策略是基于一个机器人双探头设置，集成到一个高分辨率扫描电子显微镜。通过有目的地利用纳米尺度上的主要粘附力，这种设置便于使用触觉装置组装不同纳米颗粒的整体复杂布置。本文讨论了控制问题的设置以及所提出的技术的优点和限制。
This paper presents reproducible pick and place handling of particles within the sub micron range. The handling strategy is based on a robotic dual probe setup that is integrated into a high resolution scanning electron microscope. By purposeful utilization of the predominant adhesive forces on the nanoscale, this setup facilitates the assembly of overall complex arrangements of different nanoparticles using haptic devices. The paper discusses control issues of the setup as well as the advantages and restrictions of the proposed technique.