IEC 61000-4-2 ESD test in display down configurationfor cell phones
IEC 61000-4-2 ESD test in display down configurationfor cell phones
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手机显示关闭配置下的 IEC 61000-4-2 ESD 测试
DOI：
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发表时间：
2016
期刊：
影响因子：
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通讯作者：
D. Pommerenke
中科院分区：
文献类型：
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作者：
Jianchi Zhou;Satyajeet Shinde;Yuandong Guo;A. Talebzadeh;Shubhankar Marathe;Y. Gan;Ki;D. Pommerenke
在IEC 61000-4-2测试期间，将DUT放置在0.5 mm绝缘板上，该绝缘板位于水平耦合平面（HCP）上。对于手机背面的放电点，这会导致显示屏面向HCP的情况。手机或平板电脑对HCP形成50 pF至300 pF的电容。电容值取决于手机的尺寸、屏幕平整度以及绝缘体的平整度，绝缘体的平整度可能会随着时间的推移而恶化。对电话的放电导致大的位移电流流过显示器。该电流有多条路径到达手机机身：通过触摸电子设备、通过显示电子设备以及直接到达手机机身。由于这些电流可以达到30 A（在8 kV接触模式下），它们可能导致显示器和触摸层的扰乱和损坏。本文提供了显示器下降测试情况的分析，以显示再现性问题。电容变化的影响通过测量和PSPICE模型示出。全波模型被用来帮助了解有多少总电流流过手机的身体。采用Lichtenberg尘埃图法研究了电晕放电对尘埃的贡献。
During the IEC 61000-4-2 test the DUT is placed on a 0.5 mm insulating sheet, which is on the horizontal coupling plane (HCP). For discharge points on the back side of the phone this leads to a situation in which the display is facing the HCP. The phone or tablet forms a capacitance between 50 pF and 300 pF to the HCP. The capacitance value depends on the size of the phone, its screen flatness, and the flatness of the insulator which may deteriorate over time. The discharges to the phone lead to a large displacement current flowing through the display. This current has multiple paths to the body of the phone: via the touch electronics, via the display electronics, and directly to the body of the phone. As these currents can reach 30 A (at 8 kV contact mode) they can lead to upset and damage of both the display and the touch layers. This paper provides analysis of the display down test situation in order to show reproducibility problems. The effect of the capacitance variation is shown by the measurement and the PSPICE model. Full-wave model was used to help understand how much of the total current flows through the body of the phone. The Lichtenberg dust figure method was used to show the contribution of the corona discharge.