Mapping induction distributions by transmission electron microscopy (invited)
Mapping induction distributions by transmission electron microscopy (invited)
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通过透射电子显微镜绘制感应分布（邀请）
DOI：
10.1063/1.347775
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发表时间：
1991
影响因子：
3.2
通讯作者：
S. Hefferman
中科院分区：
文献类型：
--
作者：
J. Chapman;S. McVitie;S. Hefferman
傅科和微分相衬模式的透射电子显微镜的描述和它们的使用映射在磁性薄膜中的感应分布进行比较。前者实现简单，但后者可以提供更高空间分辨率的定量信息。例子给出的情况下，每个是最合适的。原位磁化实验期间记录的福柯图像提供了有关小规则颗粒磁化过程的有价值的信息，而最好使用改进的微分相差显微镜来研究软磁性薄膜中靠近壁的详细磁化分布。
The Foucault and differential phase contrast modes of transmission electron microscopy are described and their uses for mapping induction distributions in magnetic thin films compared. The former is simpler to implement but the latter can provide quantitative information to much higher spatial resolution. Examples are given of instances where each is most suitable. Foucault images recorded during in situ magnetizing experiments provide valuable information on the magnetization process in small regular particles while the detailed magnetization distribution close to walls in soft magnetic films is best investigated using modified differential phase contrast microscopy.