X-ray imaging polarimetry with a 2.5-μm pixel CMOS sensor for visible light at room temperature
X-ray imaging polarimetry with a 2.5-μm pixel CMOS sensor for visible light at room temperature
复制标题
DOI：
10.1117/1.jatis.5.3.035002
复制
发表时间：
2019-07-01
影响因子：
2.3
通讯作者：
Nakajimae, Hiroshi
中科院分区：
文献类型：
--
作者：
Asakura, Kazunori;Hayashida, Kiyoshi;Nakajimae, Hiroshi
尽管X射线偏振测量在天文学中很重要，但它并没有得到很好的利用。近年来的仪器创新正在改变这一状况。我们专注于一个互补金属氧化物半导体（CMOS）像素探测器与小像素尺寸，并采用它作为一个X射线光电子跟踪偏振计。我们采用的CMOS探测器是由GPixel公司开发的。并且具有2.5 μ m × 2.5 μ m的像素尺寸。虽然它是针对可见光设计的，但我们成功地在室温和大气条件下探测到能量分辨率为176 eV（FWHM）的5.9 keV的X射线光子。我们测量的X射线探测效率和偏振灵敏度照射偏振单色X射线在BL 20 B2在SPring-8，在日本的同步辐射装置。在12.4和24.8 keV处，我们分别获得7.63% +/- 0.07%和15.5% +/- 0.4%的调制因子。它表明，该传感器可用作X射线成像光谱仪和偏振仪，具有有史以来最高的空间分辨率。(C)2019年，摄影光学仪器工程师协会（SPIE）
X-ray polarimetry in astronomy has not been exploited well, despite its importance. The recent innovation of instruments is changing this situation. We focus on a complementary metal-oxide-semiconductor (CMOS) pixel detector with small pixel size and employ it as an x-ray photoelectron tracking polarimeter. The CMOS detector we employ is developed by GPixel Inc. and has a pixel size of 2.5 mu m x 2.5 mu m. Although it is designed for visible light, we succeed in detecting x-ray photons with an energy resolution of 176 eV (FWHM) at 5.9 keV at room temperature and the atmospheric condition. We measure the x-ray detection efficiency and polarimetry sensitivity by irradiating polarized monochromatic x-rays at BL20B2 in SPring-8, the synchrotron radiation facility in Japan. We obtain modulation factors of 7.63% +/- 0.07% and 15.5% +/- 0.4% at 12.4 and 24.8 keV, respectively. It demonstrates that this sensor can be used as an x-ray imaging spectrometer and polarimeter with the highest spatial resolution ever tested. (C) 2019 Society of Photo-Optical Instrumentation Engineers (SPIE)