On Selection of Counterfeit IC Detection Methods
On Selection of Counterfeit IC Detection Methods
复制标题
浅谈仿冒IC检测方法的选择
DOI：
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发表时间：
2013
期刊：
影响因子：
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通讯作者：
M. Tehranipoor
中科院分区：
文献类型：
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作者：
Ujjwal Guin;M. Tehranipoor
电子元件的假冒对全球电子供应链构成重大威胁。为了应对这种日益严重的威胁，我们创建了专门的测试、检测和避免假冒零件的服务。在本文中，我们提出了一种创新技术，考虑测试时间、成本和应用风险，确定用于假冒检测的最佳测试集。
Counterfeiting of electronic components pose a major threat to the global electronic supply chain. To counteract this increasing threat, a specialized service of testing, detection, and avoidance of counterfeit parts has been created. In this paper, we present an innovative technique to identify the optimum set of tests for counterfeit detection considering test time, cost and application risks.