Quantitative evaluation of loss mechanisms in thin film solar cells using lock-in thermography
Quantitative evaluation of loss mechanisms in thin film solar cells using lock-in thermography
复制标题
使用锁定热成像技术定量评估薄膜太阳能电池的损耗机制
DOI：
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
O. Breitenstein
中科院分区：
文献类型：
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作者：
H. Straube;J. Wagner;J. Schneider;O. Breitenstein
我们描述了三种不同处理的玻璃薄膜硅太阳能模块上的晶体硅的锁定热分析图的测量和建模。为了评估缺陷影响，测量了每个模块中单个电池的锁定热分析图的偏差系列。最大功率点偏差周围的所得图像显示出电池内部明显的珀耳帖热量重新分布，在对热成像结果进行定量评估时需要考虑到这一点。这是通过对模块内部电流进行有限差分电子模拟以及热分布模式与热模糊的卷积来完成的。该过程可以提取相关的电池性能参数，例如面积二极管暗饱和电流和非线性边缘分流电流密度，并评估这些参数对模拟照明下效率的相对影响。
We describe the measurement and modeling of lock-in thermograms for three differently processed crystalline silicon on glass thin film silicon solar modules. For the purpose of defect impact evaluation, a bias series of lock-in thermograms for a single cell in each module is measured. The resulting images around maximum power point bias show pronounced Peltier heat redistribution inside the cell, which needs to be taken into account for quantitative evaluation of the thermography results. This is done using a finite differences electronics simulation of the current flow inside the module and convolution of the heat distribution patterns with the thermal blurring. The procedure makes it possible to extract relevant cell performance parameters like the area diode dark saturation current and nonlinear edge shunting current densities as well as to evaluate the relative impact of these on the efficiency under simulated illumination.