A 256 x 256, 100-kfps, 61% Fill-Factor SPAD Image Sensor for Time-Resolved Microscopy Applications

A 256 x 256, 100-kfps, 61% Fill-Factor SPAD Image Sensor for Time-Resolved Microscopy Applications
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DOI:
10.1109/ted.2017.2779790
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发表时间:
2018-02-01
影响因子:
3.1
通讯作者:
Henderson, Robert K.
Henderson, Robert K.
中科院分区:
工程技术2区
文献类型:
--
作者:
Gyongy, Istvan;Calder, Neil;Henderson, Robert K.

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报道了一种256 × 256单光子雪崩二极管图象传感器,工作频率为100 kfps,填充因子为61%,象素间距为16 μ m。全nMOS 7 T像素允许低至4 ns的门控操作,类似于600 ps的下降时间与片内延迟生成。该传感器在卷帘快门下以0.996的时间孔径比工作。门控和冷却功能可抑制暗噪声,再加上高填充因子,使电子倍增电荷耦合器件在低光照下具有竞争力的性能,同时提供时间分辨成像模式。
A 256 x 256 single-photon avalanche diode image sensor operating at 100 kfps with fill factor of 61% and pixel pitch of 16 mu m is reported. An all-nMOS 7T pixel allows gated operation down to 4 ns and similar to 600-ps fall time with on-chip delay generation. The sensor operates with 0.996 temporal aperture ratio in rolling shutter. Gating and cooling allow the suppression of dark noise, which, in combination with the high fill factor, enables competitive low-light performance with electronmultiplying charge-coupled devices while offering time-resolved imaging modes.