Pulsed corona and dielectric‐barrier discharge processing of NO in N2
Pulsed corona and dielectric‐barrier discharge processing of NO in N2
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DOI：
10.1063/1.115984
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发表时间：
1996-06
影响因子：
4
通讯作者：
B. Penetrante;M. C. Hsiao;B. Merritt;G. Vogtlin;P. Wallman;M. Neiger;O. Wolf;T. Hammer;S. Broer
中科院分区：
文献类型：
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作者：
B. Penetrante;M. C. Hsiao;B. Merritt;G. Vogtlin;P. Wallman;M. Neiger;O. Wolf;T. Hammer;S. Broer
介绍了N2中极稀浓度NO的脉冲电晕和介质阻挡放电处理的实验结果。这些NO还原实验测量了N2的电子碰撞解离的G值，并用于推断大气压下N2放电等离子体中的有效电子平均能量。这些数据是从三个不同的实验室获得的，它们使用的电极结构、电压波形、功率测量和化学分析大相径庭。测试的放电反应器的NO还原产率都相似，对应的电子平均能量为4.0±0.5 eV。
Experimental results on pulsed corona and dielectric‐barrier discharge processing of very dilute concentrations of NO in N2 are presented. These NO reduction experiments measure the G value for electron‐impact dissociation of N2 and are used to infer the effective electron mean energy in an N2dischargeplasma at atmospheric pressure. The data have been obtained from three different laboratories using widely differing electrode structures, voltage wave forms, power measurements, and chemical analyses. The NO reduction yields from the discharge reactors tested are all similar, corresponding to an electron mean energy of 4.0±0.5 eV.