Beyond structural test, the rising need for system-level test
Beyond structural test, the rising need for system-level test
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除了结构测试之外，对系统级测试的需求不断增长
DOI：
10.1109/vlsi-dat.2018.8373238
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发表时间：
2018
期刊：
影响因子：
--
通讯作者：
Harry H. Chen
中科院分区：
文献类型：
--
作者：
Harry H. Chen
摩尔定律在半导体领域的稳步发展，使得电子学发挥核心作用的更复杂的系统得以创造。因此，对单个组件的全面测试不再足以确保整体系统性能、质量和可靠性。近年来，系统级测试作为对传统组件结构测试的补充，其重要性越来越受到广泛的重视。为了理解这一趋势，我们研究了传统测试的福尔斯不足之处以及测试填补了差距的地方。在许多情况下，系统故障是复杂组件交互的结果，导致异常情况，而不是简单和单一的根本原因。而不是局限于传统的门级故障模型，它可能是更合适的开发一个系统级的故障模型派生的复杂系统的紧急属性。故障覆盖率的新定义以及如何自动化高覆盖率测试生成是系统领域中明显的挑战。设计验证在处理系统复杂性方面面临类似挑战的最新发展可能为物联网提供可能的解决方案。其目的是激发未来基于系统的测试研究的新想法和方向，因为即将到来的5G/IoT/AI应用更深入地渗透到我们的日常生活中。
The steady march of Moore's Law in semiconductors has enabled the creation of ever more complex systems with electronics playing a central role. As a result, thorough testing of individual components is no longer adequate to ensure overall system performance, quality, and reliability. The rising importance of system-level test (SLT) to supplement traditional component structural test has gained wide recognition recently. To understand this trend, we examine where traditional testing falls short and where SLT fills the gap. In many cases, system failures are the result of complex component interactions leading to abnormal scenarios not attributable to simple and single root causes. Rather than being confined by traditional gate-level fault models, it might be more appropriate to develop a system-level fault model derived as an emergent property of complex systems. New definitions of fault coverage and how to automate high-coverage test generation are obvious challenges in the system domain. Recent developments in design verification which faces similar challenges in dealing with system complexity may offer possible solutions for SLT to draw on. The aim is to stimulate new ideas and directions for future research in system-based testing as upcoming 5G/IoT/AI-based applications penetrate deeper and pervasively into our daily lives.